Scanning Electron Microscopy
Our sophisticated scanning electron microscope (SEM) and a powerful electron microprobe provide detailed information on a material’s elemental composition, microscopic structure and surface topography.
The SEM operates in conventional high vacuum or variable pressure vacuum, which permits examination of non-metallic and non-conductive materials without coating or sample preparation. Maximum sample dimension is greater than 250 mm (10 inches) with maximum mass of 4.5 kg (10 pounds).
The SEM is equipped with light element EDS (energy-dispersive spectroscopy) to obtain qualitative information about the chemical characteristics of a sample and WDS (wavelength dispersive spectrometry) to obtain positive identification of trace or overlapping elemental X-ray lines and precise quantitative analysis.
M+P also operates a powerful electron microprobe, a scanning electron microscope (SEM) that has been optimized for flexibility and accuracy in elemental analysis. Click here for more on this capability.
